Optimal Program-Read Schemes Toward Highly Reliable Open Block Operations in 3-D Charge-Trap NAND Flash Memory - researchr publication authors

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Menghua Jia, Yachen Kong, Xuepeng Zhan, Meng Zhang 0014, Fei Wu 0005, Jiezhi Chen. Optimal Program-Read Schemes Toward Highly Reliable Open Block Operations in 3-D Charge-Trap NAND Flash Memory. IEEE Trans. on CAD of Integrated Circuits and Systems, 41(11):4797-4807, 2022. [doi]

This author has not been identified. Look up 'Menghua Jia' in GoogleThis author has not been identified. Look up 'Yachen Kong' in GoogleThis author has not been identified. Look up 'Xuepeng Zhan' in GoogleThis author has not been identified. Look up 'Meng Zhang 0014' in GoogleThis author has not been identified. Look up 'Fei Wu 0005' in GoogleThis author has not been identified. Look up 'Jiezhi Chen' in Google

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