Menghua Jia, Yachen Kong, Xuepeng Zhan, Meng Zhang 0014, Fei Wu 0005, Jiezhi Chen. Optimal Program-Read Schemes Toward Highly Reliable Open Block Operations in 3-D Charge-Trap NAND Flash Memory. IEEE Trans. on CAD of Integrated Circuits and Systems, 41(11):4797-4807, 2022. [doi]
Abstract is missing.