Wanli Jiang, Erik Peterson. Performance Comparison of VLV, ULV, and ECR Tests. In 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It s a Gamble, 28 April - 2 May 2002, Monterey, CA, USA. pages 31-36, IEEE Computer Society, 2002. [doi]
@inproceedings{JiangP02:0,
title = {Performance Comparison of VLV, ULV, and ECR Tests},
author = {Wanli Jiang and Erik Peterson},
year = {2002},
url = {http://csdl.computer.org/comp/proceedings/vts/2002/1570/00/15700031abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/JiangP02%3A0},
cites = {0},
citedby = {0},
pages = {31-36},
booktitle = {20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It s a Gamble, 28 April - 2 May 2002, Monterey, CA, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-1570-3},
}