Performance Comparison of VLV, ULV, and ECR Tests

Wanli Jiang, Erik Peterson. Performance Comparison of VLV, ULV, and ECR Tests. In 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It s a Gamble, 28 April - 2 May 2002, Monterey, CA, USA. pages 31-36, IEEE Computer Society, 2002. [doi]

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