Wanli Jiang, Erik Peterson. Performance Comparison of VLV, ULV, and ECR Tests. In 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It s a Gamble, 28 April - 2 May 2002, Monterey, CA, USA. pages 31-36, IEEE Computer Society, 2002. [doi]
Abstract is missing.