Wanli Jiang - researchr alias

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Viewing Publication 1 - 17 from 17

2024

NVAutoNet: Fast and Accurate 360° 3D Visual Perception For Self DrivingTrung Pham, Mehran Maghoumi, Wanli Jiang, Bala Siva Sashank Jujjavarapu, Mehdi Sajjadi, Xin Liu, Hsuan-Chu Lin, Bor-Jeng Chen, Giang Truong, Chao Fang, Junghyun Kwon, Minwoo Park. wacv 2024: 7361-7370 [doi]

2022

Confidence Propagation Cluster: Unleash Full Potential of Object DetectorsYichun Shen, Wanli Jiang, Zhen Xu, Rundong Li, Junghyun Kwon. cvpr 2022: 1141-1151 [doi]

2020

A real-time matching algorithm using sparse matrixAomei Li, Wanli Jiang, Po Ma, Jiahui Guo, Weihua Yuan, Dehui Dai. ijguc, 11(1):1-9, 2020. [doi]

2017

An Online Approach for Gesture Recognition Toward Real-World ApplicationsZhaoxuan Fan, Tianwei Lin, Xu Zhao, Wanli Jiang, Tao Xu, Ming Yang. icig 2017: 262-272 [doi]

2016

Silicon cavity resonator based on locally resonant phononic crystalWanli Jiang, Duan Feng, Dehui Xu, Bin Xiong, Yuelin Wang, Wanli Jiang, Duan Feng. ieeesensors 2016: 1-3 [doi]

2003

Effectiveness Improvement of ECR TestsWanli Jiang, Erik Peterson, Bob Robotka. itc 2003: 699-708 [doi]

Performance Comparison of VLV, ULV, and ECR TestsWanli Jiang, Eric Peterson. et, 19(2):137-147, 2003. [doi]

2002

Performance Comparison of VLV, ULV, and ECR TestsWanli Jiang, Erik Peterson. vts 2002: 31-36 [doi]

Statistical threshold formulation for dynamic I::dd:: testWanli Jiang, Bapiraju Vinnakota. tcad, 21(6):694-705, 2002. [doi]

2001

Defect-oriented test schedulingWanli Jiang, Bapiraju Vinnakota. tvlsi, 9(3):427-438, 2001. [doi]

Practical application of energy consumption ratio testErik Peterson, Wanli Jiang. itc 2001: 386-394

2000

IC test using the energy consumption ratioWanli Jiang, Bapiraju Vinnakota. tcad, 19(1):129-141, 2000. [doi]

1999

IC Test Using the Energy Consumption RatioWanli Jiang, Bapiraju Vinnakota. dac 1999: 976-981 [doi]

Statistical threshold formulation for dynamic I_dd testWanli Jiang, Bapiraju Vinnakota. itc 1999: 57-66

Defect-Oriented Test SchedulingWanli Jiang, Bapiraju Vinnakota. vts 1999: 433-439 [doi]

1998

Fast State VerificationDechang Sun, Bapiraju Vinnakota, Wanli Jiang. dac 1998: 619-624 [doi]

Process-tolerant test with energy consumption ratioBapiraju Vinnakota, Wanli Jiang, Dechang Sun. itc 1998: 1027-1036 [doi]

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