An Effective Power-Aware At-Speed Test Methodology for IP Qualification and Characterization

Kapil Juneja, Darayus Adil Patel, Rajesh Kumar Immadi, Balwant Singh, Sylvie Naudet, Pankaj Agarwal, Arnaud Virazel, Patrick Girard 0001. An Effective Power-Aware At-Speed Test Methodology for IP Qualification and Characterization. J. Electronic Testing, 32(6):721-733, 2016. [doi]

Authors

Kapil Juneja

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Darayus Adil Patel

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Rajesh Kumar Immadi

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Balwant Singh

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Sylvie Naudet

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Pankaj Agarwal

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Arnaud Virazel

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Patrick Girard 0001

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