Kapil Juneja, Darayus Adil Patel, Rajesh Kumar Immadi, Balwant Singh, Sylvie Naudet, Pankaj Agarwal, Arnaud Virazel, Patrick Girard 0001. An Effective Power-Aware At-Speed Test Methodology for IP Qualification and Characterization. J. Electronic Testing, 32(6):721-733, 2016. [doi]
Abstract is missing.