Kapil Juneja, Darayus Adil Patel, Rajesh Kumar Immadi, Balwant Singh, Sylvie Naudet, Pankaj Agarwal, Arnaud Virazel, Patrick Girard 0001. An Effective Power-Aware At-Speed Test Methodology for IP Qualification and Characterization. J. Electronic Testing, 32(6):721-733, 2016. [doi]
@article{JunejaPISNAVG16,
title = {An Effective Power-Aware At-Speed Test Methodology for IP Qualification and Characterization},
author = {Kapil Juneja and Darayus Adil Patel and Rajesh Kumar Immadi and Balwant Singh and Sylvie Naudet and Pankaj Agarwal and Arnaud Virazel and Patrick Girard 0001},
year = {2016},
doi = {10.1007/s10836-016-5621-1},
url = {http://dx.doi.org/10.1007/s10836-016-5621-1},
researchr = {https://researchr.org/publication/JunejaPISNAVG16},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {32},
number = {6},
pages = {721-733},
}