Pedram Khademsameni, Marek Syrzycki. Manufacturability Analysis of Analog CMOS ICs through Examination of Multiple Layout Solutions. In 17th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2002), 6-8 November 2002, Vancouver, BC, Canada, Proceedings. pages 3-11, IEEE Computer Society, 2002. [doi]
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