An 8 Gb/s/pin 9.6 ns Row-Cycle 288 Mb Deca-Data Rate SDRAM With an I/O Error Detection Scheme

Kyu-hyoun Kim, Hoeju Chung, Woo-Seop Kim, Moon-Sook Park, Young-Chan Jang, Jinyoung Kim, Hwan-Wook Park, Uksong Kang, Paul W. Coteus, Joo-Sun Choi, Changhyun Kim. An 8 Gb/s/pin 9.6 ns Row-Cycle 288 Mb Deca-Data Rate SDRAM With an I/O Error Detection Scheme. J. Solid-State Circuits, 42(1):193-200, 2007. [doi]

@article{KimCKPJKPKCCK07,
  title = {An 8 Gb/s/pin 9.6 ns Row-Cycle 288 Mb Deca-Data Rate SDRAM With an I/O Error Detection Scheme},
  author = {Kyu-hyoun Kim and Hoeju Chung and Woo-Seop Kim and Moon-Sook Park and Young-Chan Jang and Jinyoung Kim and Hwan-Wook Park and Uksong Kang and Paul W. Coteus and Joo-Sun Choi and Changhyun Kim},
  year = {2007},
  doi = {10.1109/JSSC.2006.888297},
  url = {https://doi.org/10.1109/JSSC.2006.888297},
  researchr = {https://researchr.org/publication/KimCKPJKPKCCK07},
  cites = {0},
  citedby = {0},
  journal = {J. Solid-State Circuits},
  volume = {42},
  number = {1},
  pages = {193-200},
}