Derivation of test set for detecting multiple missing-gate faults in reversible circuits

Dipak K. Kole, Hafizur Rahaman, Debesh K. Das, Bhargab B. Bhattacharya. Derivation of test set for detecting multiple missing-gate faults in reversible circuits. Computers & Electrical Engineering, 39(2):225-236, 2013. [doi]

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