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Defect Oriented Testing for Analog/Mixed-Signal Designs

Bram Kruseman, Bratislav Tasic, Camelia Hora, Jos Dohmen, Hamidreza Hashempour, Maikel van Beurden, Yizi Xing. Defect Oriented Testing for Analog/Mixed-Signal Designs. IEEE Design & Test of Computers, 29(5):72-80, 2012. [doi]

Authors

Bram Kruseman

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Bratislav Tasic

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Camelia Hora

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Jos Dohmen

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Hamidreza Hashempour

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Maikel van Beurden

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Yizi Xing

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