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Bram Kruseman, Bratislav Tasic, Camelia Hora, Jos Dohmen, Hamidreza Hashempour, Maikel van Beurden, Yizi Xing. Defect Oriented Testing for Analog/Mixed-Signal Designs. IEEE Design & Test of Computers, 29(5):72-80, 2012. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Defect-oriented testing of mixed-signal ICs: some industrial experienceY. Xing. itc 1998: 678-687 [doi] Defect Oriented Testing for analog/mixed-signal devicesBram Kruseman, Bratislav Tasic, Camelia Hora, Jos Dohmen, Hamidreza Hashempour, Maikel van Beurden, Yizi Xing. itc 2011: 1-10 [doi]
The following publications are possibly variants of this publication: