Defect Oriented Testing for Analog/Mixed-Signal Designs

Bram Kruseman, Bratislav Tasic, Camelia Hora, Jos Dohmen, Hamidreza Hashempour, Maikel van Beurden, Yizi Xing. Defect Oriented Testing for Analog/Mixed-Signal Designs. IEEE Design & Test of Computers, 29(5):72-80, 2012. [doi]

@article{KrusemanTHDHBX12,
  title = {Defect Oriented Testing for Analog/Mixed-Signal Designs},
  author = {Bram Kruseman and Bratislav Tasic and Camelia Hora and Jos Dohmen and Hamidreza Hashempour and Maikel van Beurden and Yizi Xing},
  year = {2012},
  doi = {10.1109/MDT.2012.2210852},
  url = {http://doi.ieeecomputersociety.org/10.1109/MDT.2012.2210852},
  researchr = {https://researchr.org/publication/KrusemanTHDHBX12},
  cites = {0},
  citedby = {0},
  journal = {IEEE Design & Test of Computers},
  volume = {29},
  number = {5},
  pages = {72-80},
}