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Evolution of LF noise in Power PHEMT s submitted to RF and DC Step Stresses

B. Lambert, N. Malbert, N. Labat, F. Verdier, A. Touboul, P. Huguet, R. Bonnet, G. Pataut. Evolution of LF noise in Power PHEMT s submitted to RF and DC Step Stresses. Microelectronics Reliability, 41(9-10):1573-1578, 2001.

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B. Lambert

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N. Malbert

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N. Labat

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F. Verdier

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A. Touboul

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P. Huguet

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R. Bonnet

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G. Pataut

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