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B. Lambert, N. Malbert, N. Labat, F. Verdier, A. Touboul, P. Huguet, R. Bonnet, G. Pataut. Evolution of LF noise in Power PHEMT s submitted to RF and DC Step Stresses. Microelectronics Reliability, 41(9-10):1573-1578, 2001.
Abstract is missing.