B. Lambert, N. Malbert, N. Labat, F. Verdier, A. Touboul, P. Huguet, R. Bonnet, G. Pataut. Evolution of LF noise in Power PHEMT s submitted to RF and DC Step Stresses. Microelectronics Reliability, 41(9-10):1573-1578, 2001.
@article{LambertMLVTHBP01,
title = {Evolution of LF noise in Power PHEMT s submitted to RF and DC Step Stresses},
author = {B. Lambert and N. Malbert and N. Labat and F. Verdier and A. Touboul and P. Huguet and R. Bonnet and G. Pataut},
year = {2001},
researchr = {https://researchr.org/publication/LambertMLVTHBP01},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {41},
number = {9-10},
pages = {1573-1578},
}