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Kuen-Jong Lee, Tong-Yu Hsieh, Melvin A. Breuer. Efficient Overdetection Elimination of Acceptable Faults for Yield Improvement. IEEE Trans. on CAD of Integrated Circuits and Systems, 31(5):754-764, 2012. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Reduction of detected acceptable faults for yield improvement via error-toleranceTong-Yu Hsieh, Kuen-Jong Lee, Melvin A. Breuer. date 2007: 1599-1604 [doi] Tolerance of performance degrading faults for effective yield improvementTong-Yu Hsieh, Melvin A. Breuer, Murali Annavaram, Sandeep K. Gupta, Kuen-Jong Lee. itc 2009: 1-10 [doi]
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