The following publications are possibly variants of this publication:
- Gate oxide leakage current analysis and reduction for VLSI circuitsDongwoo Lee, David Blaauw, Dennis Sylvester. tvlsi, 12(2):155-166, 2004.
- Statistical static timing analysis considering leakage variability in power gated designsMichael J. Anderson, Azadeh Davoodi, Jungseob Lee, Abhishek A. Sinkar, Nam Sung Kim. islped 2009: 57-62 [doi]
- Simultaneous Subthreshold and Gate-Oxide Tunneling Leakage Current Analysis in Nanometer CMOS DesignDongwoo Lee, Wesley Kwong, David Blaauw, Dennis Sylvester. isqed 2003: 287-292 [doi]