The following publications are possibly variants of this publication:
- Computer-aided redesign of VLSI circuits for hot-carrier reliabilityPing-Chung Li, Ibrahim N. Hajj. tcad, 15(5):453-464, 1996. [doi]
- Computer-Aided Redesign of VLSI Circuits for Hot-Carrier ReliabilityPing-Chung Li, Ibrahim N. Hajj. iccd 1993: 534-537
- A unified FinFET reliability model including high K gate stack dynamic threshold voltage, hot carrier injection, and negative bias temperature instabilityChenyue Ma, Bo Li, Lining Zhang, Jin He, Xing Zhang, Xinnan Lin, Mansun Chan. isqed 2009: 7-12 [doi]
- Design and Implementation of a Random Data-Placement System with High Scalability, Reliability and PerformanceKun Liu, Wei Xue, Di Wang, Jiwu Shu. iccS 2006: 695-702 [doi]