On Removing Redundant Faults in Synchronous Sequential Circuits

Xijiang Lin, Irith Pomeranz, Sudhakar M. Reddy. On Removing Redundant Faults in Synchronous Sequential Circuits. In 16th IEEE VLSI Test Symposium (VTS 98), 28 April - 1 May 1998, Princeton, NJ, USA. pages 168-175, IEEE Computer Society, 1998. [doi]

@inproceedings{LinPR98,
  title = {On Removing Redundant Faults in Synchronous Sequential Circuits},
  author = {Xijiang Lin and Irith Pomeranz and Sudhakar M. Reddy},
  year = {1998},
  url = {http://csdl2.computer.org/dl/proceedings/vts/1998/8436/00/84360168.pdf},
  researchr = {https://researchr.org/publication/LinPR98},
  cites = {0},
  citedby = {0},
  pages = {168-175},
  booktitle = {16th IEEE VLSI Test Symposium (VTS  98), 28 April - 1 May 1998, Princeton, NJ, USA},
  publisher = {IEEE Computer Society},
  isbn = {0-8186-8436-4},
}