On Removing Redundant Faults in Synchronous Sequential Circuits

Xijiang Lin, Irith Pomeranz, Sudhakar M. Reddy. On Removing Redundant Faults in Synchronous Sequential Circuits. In 16th IEEE VLSI Test Symposium (VTS 98), 28 April - 1 May 1998, Princeton, NJ, USA. pages 168-175, IEEE Computer Society, 1998. [doi]

Abstract

Abstract is missing.