The following publications are possibly variants of this publication:
- On identifying undetectable and redundant faults in synchronous sequential circuitsIrith Pomeranz, Sudhakar M. Reddy. vts 1994: 8-14 [doi]
- On finding undetectable and redundant faults in synchronous sequential circuitsXijiang Lin, Irith Pomeranz, Sudhakar M. Reddy. In ICCD. 1998: 498-503 [doi]
- On masking of redundant faults in synchronous sequential circuits with design-for-testability logicIrith Pomeranz, Sudhakar M. Reddy. tcad, 24(2):288-294, 2005. [doi]
- Procedures for Identifying Undetectable and Redundant Faults In Synchronous Sequential CircuitsSudhakar M. Reddy, Irith Pomeranz, Nadir Z. Basturkmen, Xijiang Lin. vts 1999: 275-283 [doi]
- Procedures for Identifying Untestable and Redundant Transition Faults in Synchronous Sequential CircuitsGang Chen, Sudhakar M. Reddy, Irith Pomeranz. iccd 2003: 36-41 [doi]
- Invariant States and Redundant Logic in Synchronous Sequential CircuitsIrith Pomeranz. tcad, 26(6):1171-1175, 2007. [doi]
- On Fault Simulation for Synchronous Sequential CircuitsIrith Pomeranz, Sudhakar M. Reddy. TC, 44(2):335-340, 1995.
- Classification of Faults in Synchronous Sequential CircuitsIrith Pomeranz, Sudhakar M. Reddy. TC, 42(9):1066-1077, 1993.
- On Generating Tests that Avoid the Detection of Redundant Faults in Synchronous Sequential Circuits with Full ScanIrith Pomeranz, Sudhakar M. Reddy. TC, 55(4):491-495, 2006. [doi]
- On Removing Redundancies from Synchronous Sequential Circuits with Synchronizing SequencesIrith Pomeranz, Sudhakar M. Reddy. TC, 45(1):20-32, 1996.
- Parallel sequence fault simulation for synchronous sequential circuitsChen-Pin Kung, Chen-Shang Lin. et, 9(3):267-277, 1996. [doi]