The following publications are possibly variants of this publication:
- Time-domain performance bound analysis of analog circuits considering process variationsXuexin Liu, Sheldon X.-D. Tan, Zhigang Hao, Guoyong Shi. aspdac 2012: 535-540 [doi]
- Time-domain performance bound analysis for analog and interconnect circuits considering process variationsTan Yu, Sheldon X.-D. Tan, Yici Cai, Puying Tang. aspdac 2014: 455-460 [doi]
- Performance bound analysis of analog circuits considering process variationsZhigang Hao, Sheldon X.-D. Tan, Ruijing Shen, Guoyong Shi. dac 2011: 310-315 [doi]
- Performance bound and yield analysis for analog circuits under process variationsXuexin Liu, Adolfo Adair Palma-Rodriguez, Santiago Rodriguez-Chavez, Sheldon X.-D. Tan, Esteban Tlelo-Cuautle, Yici Cai. aspdac 2013: 761-766 [doi]