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Ling Lv, J. G. Ma, Y. R. Cao, J. C. Zhang, W. Zhang, L. Li, S. R. Xu, X. H. Ma, X. T. Ren, Y. Hao. Study of proton irradiation effects on AlGaN/GaN high electron mobility transistors. Microelectronics Reliability, 51(12):2168-2172, 2011. [doi]
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