ATPG for scan chain latches and flip-flops

Samy Makar, Edward J. McCluskey. ATPG for scan chain latches and flip-flops. In 15th IEEE VLSI Test Symposium (VTS 97), April 27-May 1, 1997, Monterey, California, USA. pages 364-369, IEEE Computer Society, 1997. [doi]

Authors

Samy Makar

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Edward J. McCluskey

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