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Samy Makar, Edward J. McCluskey. ATPG for scan chain latches and flip-flops. In 15th IEEE VLSI Test Symposium (VTS 97), April 27-May 1, 1997, Monterey, California, USA. pages 364-369, IEEE Computer Society, 1997. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Functional Tests for Scan Chain LatchesSamy Makar, Edward J. McCluskey. itc 1995: 606-615 A layout-based approach for ordering scan chain flip-flopsSamy Makar. itc 1998: 341-347 [doi]
The following publications are possibly variants of this publication: