J. Martín-Martínez, E. Amat, M. B. Gonzalez, P. Verheyen, R. Rodríguez, M. Nafría, X. Aymerich, E. Simoen. SPICE modelling of hot-carrier degradation in Si::1-::::x::Ge::x:: S/D and HfSiON based pMOS transistors. Microelectronics Reliability, 50(9-11):1263-1266, 2010. [doi]
@article{Martin-MartinezAGVRNAS10,
title = {SPICE modelling of hot-carrier degradation in Si::1-::::x::Ge::x:: S/D and HfSiON based pMOS transistors},
author = {J. Martín-Martínez and E. Amat and M. B. Gonzalez and P. Verheyen and R. Rodríguez and M. Nafría and X. Aymerich and E. Simoen},
year = {2010},
doi = {10.1016/j.microrel.2010.07.150},
url = {http://dx.doi.org/10.1016/j.microrel.2010.07.150},
tags = {rule-based, e-science},
researchr = {https://researchr.org/publication/Martin-MartinezAGVRNAS10},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {50},
number = {9-11},
pages = {1263-1266},
}