SPICE modelling of hot-carrier degradation in Si::1-::::x::Ge::x:: S/D and HfSiON based pMOS transistors - researchr publication related

researchr

You are not signed in
Sign in
Sign up

J. Martín-Martínez, E. Amat, M. B. Gonzalez, P. Verheyen, R. Rodríguez, M. Nafría, X. Aymerich, E. Simoen. SPICE modelling of hot-carrier degradation in Si::1-::::x::Ge::x:: S/D and HfSiON based pMOS transistors. Microelectronics Reliability, 50(9-11):1263-1266, 2010. [doi]

The following publications are possibly variants of this publication:

A SPICE-Based Maturity Model for the Governance and Management of Green ITJ. David Patón-Romero, Moisés Rodríguez, Mario Piattini. SPICE 2017: 143-155 [doi]

runs on WebDSL