Hiroo Masuda, Shin-ichi Ohkawa, Atsushi Kurokawa, Masakazu Aoki. Challenge: variability characterization and modeling for 65- to 90-nm processes. In Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, CICC 2005, DoubleTree Hotel, San Jose, California, USA, September 18-21, 2005. pages 593-599, IEEE, 2005. [doi]
Abstract is missing.