Full-scan LBIST with capture-per-cycle hybrid test points

Sylwester Milewski, Nilanjan Mukherjee, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer, Justyna Zawada. Full-scan LBIST with capture-per-cycle hybrid test points. In IEEE International Test Conference, ITC 2017, Fort Worth, TX, USA, October 31 - Nov. 2, 2017. pages 1-9, IEEE, 2017. [doi]

Authors

Sylwester Milewski

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Nilanjan Mukherjee

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Janusz Rajski

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Jedrzej Solecki

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Jerzy Tyszer

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Justyna Zawada

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