Sylwester Milewski, Nilanjan Mukherjee, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer, Justyna Zawada. Full-scan LBIST with capture-per-cycle hybrid test points. In IEEE International Test Conference, ITC 2017, Fort Worth, TX, USA, October 31 - Nov. 2, 2017. pages 1-9, IEEE, 2017. [doi]
@inproceedings{MilewskiMRSTZ17,
title = {Full-scan LBIST with capture-per-cycle hybrid test points},
author = {Sylwester Milewski and Nilanjan Mukherjee and Janusz Rajski and Jedrzej Solecki and Jerzy Tyszer and Justyna Zawada},
year = {2017},
doi = {10.1109/TEST.2017.8242036},
url = {https://doi.org/10.1109/TEST.2017.8242036},
researchr = {https://researchr.org/publication/MilewskiMRSTZ17},
cites = {0},
citedby = {0},
pages = {1-9},
booktitle = {IEEE International Test Conference, ITC 2017, Fort Worth, TX, USA, October 31 - Nov. 2, 2017},
publisher = {IEEE},
isbn = {978-1-5386-3413-4},
}