A BIST scheme for the detection of path-delay faults - researchr publication authors

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Nilanjan Mukherjee, Tapan J. Chakraborty, Sudipta Bhawmik. A BIST scheme for the detection of path-delay faults. In Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998. pages 422, IEEE Computer Society, 1998. [doi]

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