Nilanjan Mukherjee, Tapan J. Chakraborty, Sudipta Bhawmik. A BIST scheme for the detection of path-delay faults. In Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998. pages 422, IEEE Computer Society, 1998. [doi]
@inproceedings{MukherjeeCB98,
title = {A BIST scheme for the detection of path-delay faults},
author = {Nilanjan Mukherjee and Tapan J. Chakraborty and Sudipta Bhawmik},
year = {1998},
url = {http://www.computer.org/proceedings/itc/5093/50930422abs.htm},
researchr = {https://researchr.org/publication/MukherjeeCB98},
cites = {0},
citedby = {0},
pages = {422},
booktitle = {Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998},
publisher = {IEEE Computer Society},
isbn = {0-7803-5093-6},
}