Toru Nakura, Koichi Nose, Masayuki Mizuno. Fine-Grain Redundant Logic Using Defect-Prediction Flip-Flops. In 2007 IEEE International Solid-State Circuits Conference, ISSCC 2007, Digest of Technical Papers, San Francisco, CA, USA, February 11-15, 2007. pages 402-611, IEEE, 2007. [doi]
Abstract is missing.