A. Ney, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian. Slow write driver faults in 65nm SRAM technology: analysis and March test solution. In Rudy Lauwereins, Jan Madsen, editors, 2007 Design, Automation and Test in Europe Conference and Exposition (DATE 2007), April 16-20, 2007, Nice, France. pages 528-533, ACM, 2007. [doi]
Abstract is missing.