Slow write driver faults in 65nm SRAM technology: analysis and March test solution - researchr publication related

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A. Ney, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian. Slow write driver faults in 65nm SRAM technology: analysis and March test solution. In Rudy Lauwereins, Jan Madsen, editors, 2007 Design, Automation and Test in Europe Conference and Exposition (DATE 2007), April 16-20, 2007, Nice, France. pages 528-533, ACM, 2007. [doi]

The following publications are possibly variants of this publication:

Dynamic read destructive fault in embedded-SRAMs: analysis and march test solutionLuigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri, Magali Bastian Hage-Hassan. ets 2004: 140-145 [doi]

Resistive-Open Defects in Embedded-SRAM Core Cells: Analysis and March Test SolutionLuigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri, Magali Bastian Hage-Hassan. ats 2004: 266-271 [doi]

An SRAM Design-for-Diagnosis Solution Based on Write Driver Voltage SensingA. Ney, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian, V. Gouin. vts 2008: 89-94 [doi]

Un-Restored Destructive Write Faults Due to Resistive-Open Defects in the Write Driver of SRAMsA. Ney, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian. vts 2007: 361-368 [doi]

Analysis of Dynamic Faults in Embedded-SRAMs: Implications for Memory TestSimone Borri, Magali Bastian Hage-Hassan, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel. et, 21(2):169-179, 2005. [doi]

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