Orthogonal Scan: Low-Overhead Scan for Data Paths - researchr publication authors

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Robert B. Norwood, Edward J. McCluskey. Orthogonal Scan: Low-Overhead Scan for Data Paths. In Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996. pages 659-668, IEEE Computer Society, 1996.

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