Robert B. Norwood, Edward J. McCluskey. Orthogonal Scan: Low-Overhead Scan for Data Paths. In Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996. pages 659-668, IEEE Computer Society, 1996.
@inproceedings{NorwoodM96,
title = {Orthogonal Scan: Low-Overhead Scan for Data Paths},
author = {Robert B. Norwood and Edward J. McCluskey},
year = {1996},
tags = {data-flow},
researchr = {https://researchr.org/publication/NorwoodM96},
cites = {0},
citedby = {0},
pages = {659-668},
booktitle = {Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996},
publisher = {IEEE Computer Society},
isbn = {0-7803-3541-4},
}