Ryu Ogiwara, Daisaburo Takashima, Sumiko Doumae, Shinichiro Shiratake, Ryosuke Takizawa, Hidehiro Shiga. Highly Reliable Reference Bitline Bias Designs for 64 Mb and 128 Mb Chain FeRAMs. J. Solid-State Circuits, 50(5):1324-1331, 2015. [doi]
@article{OgiwaraTDSTS15,
title = {Highly Reliable Reference Bitline Bias Designs for 64 Mb and 128 Mb Chain FeRAMs},
author = {Ryu Ogiwara and Daisaburo Takashima and Sumiko Doumae and Shinichiro Shiratake and Ryosuke Takizawa and Hidehiro Shiga},
year = {2015},
doi = {10.1109/JSSC.2015.2405932},
url = {http://dx.doi.org/10.1109/JSSC.2015.2405932},
researchr = {https://researchr.org/publication/OgiwaraTDSTS15},
cites = {0},
citedby = {0},
journal = {J. Solid-State Circuits},
volume = {50},
number = {5},
pages = {1324-1331},
}