Kaoru Okazaki, Toshihiko Yahara. Efficient Logic Verification and Test Validation for MOS LSI Circuits. In Proceedings International Test Conference 1981, Philadelphia, PA, USA, October 1981. pages 530-535, IEEE Computer Society, 1981.
@inproceedings{OkazakiY81, title = {Efficient Logic Verification and Test Validation for MOS LSI Circuits}, author = {Kaoru Okazaki and Toshihiko Yahara}, year = {1981}, tags = {testing, logic}, researchr = {https://researchr.org/publication/OkazakiY81}, cites = {0}, citedby = {0}, pages = {530-535}, booktitle = {Proceedings International Test Conference 1981, Philadelphia, PA, USA, October 1981}, publisher = {IEEE Computer Society}, }