Michael Orshansky, Linda Milor, Pinhong Chen, Kurt Keutzer, Chenming Hu. Impact of Systematic Spatial Intra-Chip Gate Length Variability on Performance of High-Speed Digital Circuits. In Ellen Sentovich, editor, Proceedings of the 2000 IEEE/ACM International Conference on Computer-Aided Design, 2000, San Jose, California, USA, November 5-9, 2000. pages 62-67, IEEE, 2000.
Abstract is missing.