Takao Oshita, Joseph Shor, David E. Duarte, Avner Kornfeld, George L. Geannopoulos, Jonathan Douglas, Nasser A. Kurd. A Compact First-Order $\Sigma\Delta $ Modulator for Analog High-Volume Testing of Complex System-on-Chips in a 14 nm Tri-Gate Digital CMOS Process. J. Solid-State Circuits, 51(2):378-390, 2016. [doi]
@article{OshitaSDKGDK16,
title = {A Compact First-Order $\Sigma\Delta $ Modulator for Analog High-Volume Testing of Complex System-on-Chips in a 14 nm Tri-Gate Digital CMOS Process},
author = {Takao Oshita and Joseph Shor and David E. Duarte and Avner Kornfeld and George L. Geannopoulos and Jonathan Douglas and Nasser A. Kurd},
year = {2016},
doi = {10.1109/JSSC.2015.2501424},
url = {http://dx.doi.org/10.1109/JSSC.2015.2501424},
researchr = {https://researchr.org/publication/OshitaSDKGDK16},
cites = {0},
citedby = {0},
journal = {J. Solid-State Circuits},
volume = {51},
number = {2},
pages = {378-390},
}