Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
D. Othman, Stéphane Lefebvre, Mounira Berkani, Zoubir Khatir, A. Ibrahim, A. Bouzourene. Robustness of 1.2 kV SiC MOSFET devices. Microelectronics Reliability, 53(9-11):1735-1738, 2013. [doi]
Abstract is missing.