Rubin A. Parekhji, G. Venkatesh, Sunil D. Sherlekar. A Methodology for Designing Optimal Self-Checking Sequential Circuits. In Proceedings IEEE International Test Conference 1991, Test: Faster, Better, Sooner, Nashville, TN, USA, October 26-30, 1991. pages 283-291, IEEE Computer Society, 1991.
Abstract is missing.