A Functional Coverage Metric for Estimating the Gate-Level Fault Coverage of Functional Tests

Sungchul Park, Li Chen, Praveen Parvathala, Srinivas Patil, Irith Pomeranz. A Functional Coverage Metric for Estimating the Gate-Level Fault Coverage of Functional Tests. In Scott Davidson, Anne Gattiker, editors, 2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006. pages 1-10, IEEE, 2006. [doi]

Abstract

Abstract is missing.