Ravi Patel, Eby G. Friedman, Praveen Raghavan. Power noise in 14, 10, and 7 nm FinFET CMOS technologies. In IEEE International Symposium on Circuits and Systems, ISCAS 2016, Montréal, QC, Canada, May 22-25, 2016. pages 37-40, IEEE, 2016. [doi]
Abstract is missing.