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Irith Pomeranz. Design-for-testability for multi-cycle broadside tests by holding of state variables. ACM Trans. Design Autom. Electr. Syst., 19(2):19, 2014. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Generation of Multi-Cycle Broadside TestsIrith Pomeranz. tcad, 30(8):1253-1257, 2011. [doi] Built-in generation of multi-cycle broadside testsIrith Pomeranz. dft 2012: 146-151 [doi] On the use of multi-cycle tests for storage of two-cycle broadside testsIrith Pomeranz. vts 2014: 1-6 [doi] Forming multi-cycle tests for delay faults by concatenating broadside testsIrith Pomeranz, Sudhakar M. Reddy. vts 2010: 51-56 [doi] Multi-cycle broadside tests with runs of constant primary input vectorsIrith Pomeranz. iet-cdt, 8(2):90-96, 2014. [doi]
The following publications are possibly variants of this publication: