The following publications are possibly variants of this publication:
- Multicycle Broadside and Skewed-Load Tests for Test CompactionIrith Pomeranz. tcad, 39(1):262-266, 2020. [doi]
- Static test compaction procedure for large pools of multicycle functional broadside testsIrith Pomeranz. iet-cdt, 12(5):233-240, 2018. [doi]
- On Transition Fault Diagnosis Using Multicycle At-Speed Broadside TestsIrith Pomeranz. ets 2011: 189-194 [doi]
- Observation Points on State Variables for the Compaction of Multicycle TestsIrith Pomeranz. tvlsi, 26(11):2567-2571, 2018. [doi]
- Using piecewise-functional broadside tests for functional broadside test compactionIrith Pomeranz. vts 2017: 1-6 [doi]
- Padding of Multicycle Broadside and Skewed-Load TestsIrith Pomeranz. tvlsi, 27(11):2587-2595, 2019. [doi]
- Partitioning Functional Test Sequences Into Multicycle Functional Broadside TestsIrith Pomeranz. tvlsi, 29(1):89-99, 2021. [doi]
- Built-in generation of multicycle functional broadside tests with observation pointsIrith Pomeranz. todaes, 19(1):8, 2013. [doi]
- On-chip generation of primary input sequences for multicycle functional broadside testsIrith Pomeranz. iet-cdt, 12(3):80-86, 2018. [doi]